1. Ariswan, G. E. H. M., Abdelali, M., Guastavino, F., and Llinares, C. Structural, optical and electrical properties of the ordered vacancy compound CuIn3Se5 thin films fabricated by flash evaporation. Solid State Commun., 2002, 124, 391–396.
doi:10.1016/S0038-1098(02)00603-8
2. Wang, H. P., Shih, I., and Champness, C. H. Studies on monocrystalline CuInSe2 and CuIn3Se5. Thin Solid Films, 2000, 494, 361–362.
3. Malar, P. and Kasiviswanathan, S. Characterization of stepwise flash evaporated CuIn3Se5 films. Sol. Energ. Mat. Sol. C., 2005, 85, 521–533.
4. Malar, P. and Kasiviswanathan, S. A comparative study of CuInSe2 and CuIn3Se5 films using transmission electron microscopy, optical absorption and Rutherford backscattering spectrometry. Sol. Energ. Mat. Sol. C., 2005, 88, 281–292.
5. Bodnar, I. V., Gremenok, V. F., Nikolaev, Yu. A., Rud, V. Yu., Rud, Yu. V., and Terukov, E. I. Photosensitivity of thin-film structures based on CuIn3Se5 and CuIn5Se8 ternary semiconductor compounds. Tech. Phys. Lett., 2007, 33(2), 111–113.
doi:10.1134/S106378500702006X
6. Bereznev, S., Kois, J., Golovtsov, I., Öpik, A., and Mellikov, E. Electrodeposited (Cu–In–Se)/polypyrrole PV structures. Thin Solid Films, 2006, 511–512, 425–429.
doi:10.1016/j.tsf.2005.11.074
7. Bereznev, S., Koeppe, R., Konovalov, I., Kois, J., Günes, S., Öpik, A., Mellikov, E., and Sariciftci, N. S. Hybrid solar cells based on CuInS2 and organic buffer–sensitizer layers. Thin Solid Films, 2007, 515, 5759–5762.
doi:10.1016/j.tsf.2006.12.074
8. Tverjanovich, A., Borisov, E. N, Vasilieva, E. S., Tolochko, O. V., Vahhi, I. E., Bereznev, S., and Tveryanovich, Yu. S. CuInSe2 thin films deposited by UV laser ablation. Sol. Energ. Mat. Sol. C., 2006, 90, 3624–3632.
9. Wang, H. P., Shih, I., and Champness, C. H. Studies on monocrystalline CuInSe2 and CuIn3Se5. Thin Solid Films, 2000, 361–362, 494–497.
doi:10.1016/S0040-6090(99)00802-0
10. Boehnke, U. C. and Kuhn, G. Phase relations in the ternary system Cu–In–Se. J. Mater. Sci., 1987, 22, 1635–1641.
doi:10.1007/BF01132385
11. Buzea, C. and Robbie, K. Nano-sculptured thin film thickness variation with incidence angle. J. Optoelectron. Adv. Mater., 2004, 6, 1263–1268.
12. Birks, L. S. and Friedman, H. Particle size determination from X-ray line broadening. J. Appl. Phys., 1946, 16, 687–692.
doi:10.1063/1.1707771
13. Mott, N. F. and Davis, E. A. Electron Processes in Non-Crystalline Materials. Clarendon Press, Oxford, 1979.