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  Estonian Journal of Engineering

ISSN 1736-7522 (electronic)  ISSN 1736-6038  (print)

 An international scientific journal
Formerly: Proceedings of the Estonian Academy of Sciences Engineering
(ISSN 1406-0175)
Published since 1995

Estonian Journal of Engineering

ISSN 1736-7522 (electronic)  ISSN 1736-6038  (print)

 An international scientific journal
Formerly: Proceedings of the Estonian Academy of Sciences Engineering
(ISSN 1406-0175)
Published since 1995

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Calibration-free temperature measurement by p-n junctions with varied current; 409–422

(Full article in PDF format)


Authors

Olfa Kanoun

Abstract

Applying a varied current excitation to p-n junctions, calibration-free temperature measurement can be performed with improved accuracy, independent from manufacturing variance. For the realization of this method, an adequate modelling of the p-n junction I-U characteristic, taking into account semiconductor secondary effects and parameter extraction procedures, is needed. A behavioural model of this procedure is proposed. Experimental results show an improvement of accuracy relative to previous calibration-free methods. The temperature calculation procedure, which in this case is carried out within a parameter extraction procedure, converges very fast.

Keywords

temperature measurement, diode temperature sensors, silicon transistor thermometers, p-n junction, modelling.

References

  1. Tränkler , H.-R. and Kanoun , O. Improvement of sensor information using multi-sensor and model-based sensor systems. In Proc. IEEE Instrumentation and Measurement Technology Conference. Ottawa , 2005 , 2259–2263.

  2. Kanoun , O. Investigations on modeling for sensor systems with varied excitation. In Proc. Instrumentation and Measurement Technology Conference – IMTC 2007. Warsaw , 2007.

  3. Kanoun , O. and Tränkler , H.-R. Model performance improvement for a calibration-free temperature measurement based on p-n junctions. Sensors & Actuators A , 2002 , 101 , 275–282.
doi:10.1016/S0924-4247(02)00207-8

  4. Quinn , T. J. Temperature. Academic Press , London , 1983.

  5. Die SI-Basiseinheiten. Definition , Entwicklung , Realisierung. PTB , Braunschweig , Berlin , 1991 , 29–33.

  6. Verster , T. C. P-N junction as an ultralinear calculable thermometer. Electronic Lett. , 1968 , 4 , 175–176.
doi:10.1049/el:19680133

  7. Goloub , B. , Goloub , O. and Baran , A. Genauigkeitserhöhung für Transistor-Temperatur­senso­ren. In Proc. Sensor 97. Nürnberg , 1997 , vol. III , 183–188. ACS Org. GmbH , Wunstorf.

  8. Beck , J. V. and Woodbury , K. A. Inverse problems and parameter estimation: integration of measurements and analysis. Measurement Sci. Technol. , 1998 , 9 , 839–847.
doi:10.1088/0957-0233/9/6/001

  9. Kanoun , O. , Horn , M. and Tränkler , H.-R. Possibilities of a model performance improvement for the calibration-free temperature measurement based on PN-junctions. In Proc. Instru­mentation and Measurement Technology Conference. Venice , 1999 , vol. I , 6–11.

10. Holmer , R. Untersuchungen zur Genauigkeitssteigerung der kalibrationsfreien Temperatur­messung mit Halbleiter-pn-Übergängen. Fortschritt-Berichte , VDI , Reihe 8 , Nr. 587 , VDI-Verlag , Düsseldorf , 1996.

11. Kanoun , O. Neuartige Modelle zur kalibrationsfreien Temperaturmessung mit pn-Übergängen. Fortschritt-Berichte , VDI , Reihe 8 , Nr. 905 , VDI-Verlag , Düsseldorf , 2001.

 
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Current Issue: Vol. 19, Issue 4, 2013





Publishing schedule:
No. 1: 20 March
No. 2: 20 June
No. 3: 20 September
No. 4: 20 December